resolution sem hrsem jeol jsm 7400f Search Results


high resolution sem  (JEOL)
96
JEOL high resolution sem
High Resolution Sem, supplied by JEOL, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/resolution+sem+hrsem+jeol+jsm+7400f/JSM-7400F+Scanning+Electron+Microscope/10__1039_slash_c2sm26017d-37-6-10
Average 96 stars, based on 1 article reviews
high resolution sem - by Bioz Stars, 2026-11
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high resolution sem hrsem  (JEOL)
99
JEOL high resolution sem hrsem
Figure 2. <t>HRSEM</t> images of the 1.0 µm thick and 135 nm average grain size PbTe⟨In⟩film, grown with the nominal In content of 0.5 at. % on the a-SOX substrate at Ts = −50 ◦C (not listed in Table 1): (a) top view; (b) cross-sectional view.
High Resolution Sem Hrsem, supplied by JEOL, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/resolution+sem+hrsem+jeol+jsm+7400f/JEM-2100F+Transmission+Electron+Microscope/pm39769657-138-25-38
Average 99 stars, based on 1 article reviews
high resolution sem hrsem - by Bioz Stars, 2026-11
99/100 stars
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transmission electron microscopy tem  (JEOL)
99
JEOL transmission electron microscopy tem
Figure 2. <t>HRSEM</t> images of the 1.0 µm thick and 135 nm average grain size PbTe⟨In⟩film, grown with the nominal In content of 0.5 at. % on the a-SOX substrate at Ts = −50 ◦C (not listed in Table 1): (a) top view; (b) cross-sectional view.
Transmission Electron Microscopy Tem, supplied by JEOL, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/resolution+sem+hrsem+jeol+jsm+7400f/JEOL-IDES_Products+Transmission+Electron+Microscope/pmc05456799-82-14-20
Average 99 stars, based on 1 article reviews
transmission electron microscopy tem - by Bioz Stars, 2026-11
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Image Search Results


Figure 2. HRSEM images of the 1.0 µm thick and 135 nm average grain size PbTe⟨In⟩film, grown with the nominal In content of 0.5 at. % on the a-SOX substrate at Ts = −50 ◦C (not listed in Table 1): (a) top view; (b) cross-sectional view.

Journal: Materials (Basel, Switzerland)

Article Title: Polycrystalline Films of Indium-Doped PbTe on Amorphous Substrates: Investigation of the Material Based on Study of Its Structural, Transport, and Optical Properties.

doi: 10.3390/ma17246058

Figure Lengend Snippet: Figure 2. HRSEM images of the 1.0 µm thick and 135 nm average grain size PbTe⟨In⟩film, grown with the nominal In content of 0.5 at. % on the a-SOX substrate at Ts = −50 ◦C (not listed in Table 1): (a) top view; (b) cross-sectional view.

Article Snippet: Secondary (reflected and transmitted) electron images were taken by JEOL JSM-7400F (JEOL Ltd., Tokyo, Japan), FEI Quanta 200TM E-SEM (FEI Co., Hillsboro, OR, USA) for high-resolution SEM (HRSEM) with accelerating voltages in the range of 0.1–30 kV, and JEOL JEM-2100F (JEOL Ltd., Tokyo, Japan) for high-resolution TEM (HRTEM) and scanning TEM (STEM) with a constant voltage of 200 kV.

Techniques:

Figure 3. HRSEM images of the specimen KPI−5 itemized in Table 2: (a) top view; (b) cross-sectional/3D view.

Journal: Materials (Basel, Switzerland)

Article Title: Polycrystalline Films of Indium-Doped PbTe on Amorphous Substrates: Investigation of the Material Based on Study of Its Structural, Transport, and Optical Properties.

doi: 10.3390/ma17246058

Figure Lengend Snippet: Figure 3. HRSEM images of the specimen KPI−5 itemized in Table 2: (a) top view; (b) cross-sectional/3D view.

Article Snippet: Secondary (reflected and transmitted) electron images were taken by JEOL JSM-7400F (JEOL Ltd., Tokyo, Japan), FEI Quanta 200TM E-SEM (FEI Co., Hillsboro, OR, USA) for high-resolution SEM (HRSEM) with accelerating voltages in the range of 0.1–30 kV, and JEOL JEM-2100F (JEOL Ltd., Tokyo, Japan) for high-resolution TEM (HRTEM) and scanning TEM (STEM) with a constant voltage of 200 kV.

Techniques: